Linear imaging in scanning polarisation/interference contrast microscopy
- 期刊名称Electronics Letters
- 作者See, C.W.; Vaez Iravani, M.
- 卷第22卷
- 期第20期
- 印刷ISSN0013-5194
- 文件大小504.79KB
- 发表时间1986
- DOI10.1049/el:19860740
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