Using Hyperfine Interaction for the Structural Characterization of Amorphous Silicon
- 期刊名称MRS Proceedings
- 作者Stutzmann, Martin; Biegelsen, David K.
- 卷第69卷
- 电子ISSN1946-4274
- 文件大小310.56KB
- 发表时间1986-1
- DOI10.1557/proc-69-397
同期刊推荐
Ultra Thin Flexible Glass SubstratesPlichta, Armin; Weber, Andreas; Habeck, Andreas · MRS Proceedings · 2003
Principles of Ion MixingMatteson, S.; Nicolet, M.-A. · MRS Proceedings · 1981
Phase Transitions in Pure PlutoniumMitchell, Jeremy N.; Freibert, Franz, J.; Schwartz, Daniel S. · MRS Proceedings · 2012
Spintronics in NitridesDietl, Tomasz · MRS Proceedings · 2004
Dielectric Relaxation Of Semicrystalline PolyimidesHuo, Pengtao; Friler, Jerome; Cebe, Peggy · MRS Proceedings · 1991
Carbon Aerogels and XerogelsPekala, Richard W.; Alviso, Cynthia T. · MRS Proceedings · 1992
Why Covalent Ceramics are HardGilman, John J. · MRS Proceedings · 1993
Microwave Processing of Ceramics - An OverviewSutton, Willard H. · MRS Proceedings · 1992