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Correlation between deep-level parameters and energy resolution of p-type high purity Ge γ-detectors

E. Simoen; P. Clauws; G. Huylebroeck; J. Vennik; L. van Goethem; M. van Sande; L. de Laet; H. Guislain

作者E. Simoen; P. Clauws; G. Huylebroeck; J. Vennik; L. van Goethem; M. van Sande; L. de Laet; H. Guislain
卷第251卷
期第3期
印刷ISSN0168-9002
文件大小619.68KB
发表时间1986
DOI10.1016/0168-9002(86)90646-7
页码519-526