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Characterization of multilayer thin films by laser-induced thermal desorption mass spectrometry

Characterization of multilayer thin films by laser-induced thermal desorption mass spectrometry

Land, Donald P.; Tai, Tsong Lin.; Lindquist, John M.; Hemminger, John C.; McIver, Robert T.
  • 期刊名称Analytical Chemistry
  • 作者Land, Donald P.; Tai, Tsong Lin.; Lindquist, John M.; Hemminger, John C.; McIver, Robert T.
  • 卷第59卷
  • 期第24期
  • 印刷ISSN0003-2700
  • 电子ISSN1520-6882
  • 文件大小1074.10KB
  • 发表时间1987-12
  • DOI10.1021/ac00151a019
  • 页码2924-2927
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