Evidence for photoactivated defect induced dielectric anomalies in CuCL
- 期刊名称Ferroelectrics
- 作者Lefkowitz, Issai; Estes, William E.; Hatfield, William E.; Bloomfield, Philip E.
- 卷第73卷
- 期第1期
- 印刷ISSN0015-0193
- 电子ISSN1563-5112
- 文件大小404.46KB
- 发表时间1987-06
- DOI10.1080/00150198708227943
- 页码487-492
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