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SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA (Sunday 17 August 1986)] Interferometric Metrology - <title>Absolute Distance Interferometry</title>

SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA (Sunday 17 August 1986)] Interferometric Metrology - Absolute Distance Interferometry

Massie, N. A.; Caulfield, H.John; Massie, Norbert A.

作者Massie, N. A.; Caulfield, H.John; Massie, Norbert A.
卷第816卷
印刷ISSN0277-786X
文件大小454.16KB
发表时间1987
DOI10.1117/12.941763
页码149-157

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