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Applications of image processing for surface characterization and depth profiling with SIMS

Applications of image processing for surface characterization and depth profiling with SIMS

F. Michiels; W. Vanhoolst; W. Jacob; P. Van Espen; F. Adams

作者F. Michiels; W. Vanhoolst; W. Jacob; P. Van Espen; F. Adams
卷第18卷
期第3期
印刷ISSN0739-6260
文件大小116.58KB
发表时间1987
DOI10.1016/0739-6260(87)90083-9
页码249-250

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