[IEEE AUTOTESTCON '88. Symposium Proceedings IEEE International Automatic Testing Conference, Futuretest. - Minneapolis, MN, USA (4-6 Oct. 1988)] AUTOTESTCON '88. Symposium Proceedings IEEE International Automatic Testing Conference, Futuretest. - Fault insertion methodology
Parsons, W.; Zimmerman, T.
- 作者Parsons, W.; Zimmerman, T.
- 文件大小338.17KB
- 发表时间1988
- DOI10.1109/AUTEST.1988.9596
- 页码119-123