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[IEEE AUTOTESTCON '88. Symposium Proceedings IEEE International Automatic Testing Conference, Futuretest. - Minneapolis, MN, USA (4-6 Oct. 1988)] AUTOTESTCON '88. Symposium Proceedings IEEE International Automatic Testing Conference, Futuretest. - Universal pin electronics BIT application

[IEEE AUTOTESTCON '88. Symposium Proceedings IEEE International Automatic Testing Conference, Futuretest. - Minneapolis, MN, USA (4-6 Oct. 1988)] AUTOTESTCON '88. Symposium Proceedings IEEE International Automatic Testing Conference, Futuretest. - Universal pin electronics BIT application

Jackson, P.; Parker, L.

作者Jackson, P.; Parker, L.
文件大小408.82KB
发表时间1988
DOI10.1109/autest.1988.9613
页码217-221

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