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Accurate measurement of the operating frequency in ICs with the SEM

Accurate measurement of the operating frequency in ICs with the SEM

Nakamae, K; Fujioka, H; Ura, K
  • 期刊名称Journal of Physics E: Scientific Instruments
  • 作者Nakamae, K; Fujioka, H; Ura, K
  • 卷第21卷
  • 期第9期
  • 印刷ISSN0022-3735
  • 文件大小285.35KB
  • 发表时间1988-09
  • DOI10.1088/0022-3735/21/9/023
  • 页码913-915
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