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[IEEE 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway (3-6 July 1989)] Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - A model of aging of dielectric extruded cables

[IEEE 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway (3-6 July 1989)] Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - A model of aging of dielectric extruded cables

Crine, J.P.; Parpal, J.L.; Lessard, G.

作者Crine, J.P.; Parpal, J.L.; Lessard, G.
文件大小199.54KB
发表时间1989
DOI10.1109/ICSD.1989.69218
页码347-351

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