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The structure of Si(111)-(√3 × √3)R30° -Ag determined by surface X-ray diffraction

The structure of Si(111)-(√3 × √3)R30° -Ag determined by surface X-ray diffraction

E. Vlieg; A.W. Denier Van Der Gon; J.F. Van Der Veen; J.E. MacDonald; C. Norris
  • 作者E. Vlieg; A.W. Denier Van Der Gon; J.F. Van Der Veen; J.E. MacDonald; C. Norris
  • 卷第209卷
  • 印刷ISSN0167-2584
  • 文件大小49.61KB
  • 发表时间1989
  • DOI10.1016/0167-2584(89)90598-7
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