The structure of Si(111)-(√3 × √3)R30° -Ag determined by surface X-ray diffraction
E. Vlieg; A.W. Denier Van Der Gon; J.F. Van Der Veen; J.E. MacDonald; C. Norris
- 作者E. Vlieg; A.W. Denier Van Der Gon; J.F. Van Der Veen; J.E. MacDonald; C. Norris
- 卷第209卷
- 印刷ISSN0167-2584
- 文件大小49.61KB
- 发表时间1989
- DOI10.1016/0167-2584(89)90598-7