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High-temperature x-ray diffraction studies on physical vapour deposited TiN

High-temperature x-ray diffraction studies on physical vapour deposited TiN

D.S. Rickerby; S.J. Bull; A.M. Jones; F.L. Cullen; B.A. Bellamy
  • 作者D.S. Rickerby; S.J. Bull; A.M. Jones; F.L. Cullen; B.A. Bellamy
  • 印刷ISSN0257-8972
  • 文件大小993.26KB
  • 发表时间1989
  • DOI10.1016/0257-8972(89)90072-8
  • 页码397-408
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