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[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment

[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment

Rosell, F.A.; Gibson, L.
  • 作者Rosell, F.A.; Gibson, L.
  • 文件大小329.84KB
  • 发表时间1989
  • DOI10.1109/autest.1989.81127
  • 页码236-241
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