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[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - A BIST design methodology experiment

[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - A BIST design methodology experiment

Duncan, S.H.

作者Duncan, S.H.
文件大小503.26KB
发表时间1989
DOI10.1109/TEST.1989.82364
页码755-762

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