[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - A digital maintenance information (DMI) system for ATE
Landers, T.; Nguyen, M.; Delgado, R.
- 作者Landers, T.; Nguyen, M.; Delgado, R.
- 文件大小299.33KB
- 发表时间1989
- DOI10.1109/autest.1989.81133
- 页码272-276