[IEEE 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway (3-6 July 1989)] Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - A model of the electrical breakdown process due to electrical treeing growth
Bozzo, R.; Guastavino, F.; Tommasini, D.
- 作者Bozzo, R.; Guastavino, F.; Tommasini, D.
- 文件大小187.44KB
- 发表时间1989
- DOI10.1109/icsd.1989.69231
- 页码412-416