[IEEE Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (1989.02.7-1989.02.9)] Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Fast thermal analysis of hybrid integrated circuits
Lugovic, M.; Biljanovic, P.; Mazalica, M.
- 作者Lugovic, M.; Biljanovic, P.; Mazalica, M.
- 文件大小337.75KB
- 发表时间1989
- DOI10.1109/stherm.1989.76064
- 页码44-47