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[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - System level BIT: a tool for MATE test station self maintenance

[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - System level BIT: a tool for MATE test station self maintenance

Seeger, J.M.
  • 作者Seeger, J.M.
  • 文件大小351.49KB
  • 发表时间1989
  • DOI10.1109/autest.1989.81132
  • 页码267-271
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