[IEEE Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (1989.02.7-1989.02.9)] Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Thermal characteristics of buried resistors
- 作者Blanco, R.; Mansingh, V.
- 文件大小450.56KB
- 发表时间1989
- DOI10.1109/stherm.1989.76061
- 页码25-29
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