[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Interfacing to boundary scan chips for system level BIT
- 作者Turino, J.
- 文件大小259.46KB
- 发表时间1989
- DOI10.1109/autest.1989.81139
- 页码310-313