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Study on the dependence of electrical properties on dislocation levels in InSb films vacuum deposited on glass

Study on the dependence of electrical properties on dislocation levels in InSb films vacuum deposited on glass

S. Iida
  • 作者S. Iida
  • 文件大小895.84KB
  • 发表时间1989
  • DOI10.1063/1.343096
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