Electron tunneling time measured by photoluminescence excitation correlation spectroscopy
Jackson, M. K.; Johnson, M. B.; Chow, D. H.; McGill, T. C.; Nieh, C. W.
- 期刊名称Applied Physics Letters
- 作者Jackson, M. K.; Johnson, M. B.; Chow, D. H.; McGill, T. C.; Nieh, C. W.
- 卷第54卷
- 期第6期
- 印刷ISSN0003-6951
- 文件大小654.13KB
- 发表时间1989
- DOI10.1063/1.100928