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Electron tunneling time measured by photoluminescence excitation correlation spectroscopy

Electron tunneling time measured by photoluminescence excitation correlation spectroscopy

Jackson, M. K.; Johnson, M. B.; Chow, D. H.; McGill, T. C.; Nieh, C. W.
  • 期刊名称Applied Physics Letters
  • 作者Jackson, M. K.; Johnson, M. B.; Chow, D. H.; McGill, T. C.; Nieh, C. W.
  • 卷第54卷
  • 期第6期
  • 印刷ISSN0003-6951
  • 文件大小654.13KB
  • 发表时间1989
  • DOI10.1063/1.100928
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