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[IEEE 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway (3-6 July 1989)] Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Defect model and a unified approach to electrical properties in dielectric films

[IEEE 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway (3-6 July 1989)] Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Defect model and a unified approach to electrical properties in dielectric films

Lin, T.-K.; Agarwal, V.K.

作者Lin, T.-K.; Agarwal, V.K.
文件大小215.11KB
发表时间1989
DOI10.1109/icsd.1989.69203
页码272-276

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