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Electronic and Structural Characterization of the Near Surface Layer and the Bulk in νc-Si:H Prepared with Hydrogen dilution

Electronic and Structural Characterization of the Near Surface Layer and the Bulk in νc-Si:H Prepared with Hydrogen dilution

Aljishi, Samer; Jin, Shu; Stutzmann, Martin; Ley, Lothar

期刊名称MRS Proceedings
作者Aljishi, Samer; Jin, Shu; Stutzmann, Martin; Ley, Lothar
卷第164卷
电子ISSN1946-4274
文件大小304.40KB
发表时间1989-1
DOI10.1557/proc-164-51

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