SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Stray Light and Contamination in Optical Systems - BRDF Measurements At 6328 Angstroms And 10.6 Micrometers Of Optical Black Surfaces For Space Telescopes
- 作者Pompea, Stephen M.; Shepard, Donald F.; Anderson, Scot; Breault, Robert P.
- 卷第967卷
- 印刷ISSN0277-786X
- 文件大小663.97KB
- 发表时间1989
- DOI10.1117/12.948108
- 页码236-247
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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Stray Light and Contamination in Optical Systems - <title>The Effect Of Elevated Temperatures On The Scattering Properties Of An Optical Black Surface At 0.6328 And 10.6 Micrometers</title>Shepard, Donald F.; Pompea, Stephen M.; Anderson, Scot; Breault, Robert P. · 1989