[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Concurrent engineering
Lowenstein, A.; Schlosser, S.; Winter, G.
- 作者Lowenstein, A.; Schlosser, S.; Winter, G.
- 文件大小204.39KB
- 发表时间1990
- DOI10.1109/TEST.1990.114028
- 页码258-259