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[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Errors in testing

[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Errors in testing

Williams, R.H.; Hawkins, C.F.

作者Williams, R.H.; Hawkins, C.F.
文件大小564.17KB
发表时间1990
DOI10.1109/test.1990.114125
页码1018-1027

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