Built-in self-test of the Macrolan chip
- 期刊名称IEEE Design & Test of Computers
- 作者Illman, R.; Clarke, S.
- 卷第7卷
- 期第2期
- 印刷ISSN0740-7475
- 文件大小910.39KB
- 发表时间1990-04
- DOI10.1109/54.53043
- 页码29-40
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