Electron transport and impact ionization in Si
Sano, Nobuyuki; Aoki, Takahiro; Tomizawa, Masaaki; Yoshii, Akira
- 期刊名称Physical Review B
- 作者Sano, Nobuyuki; Aoki, Takahiro; Tomizawa, Masaaki; Yoshii, Akira
- 卷第41卷
- 期第17期
- 印刷ISSN0163-1829
- 电子ISSN1095-3795
- 文件大小385.30KB
- 发表时间1990-6-15
- DOI10.1103/PhysRevB.41.12122
- 页码12122-12128