[IEEE IEEE Symposium on Ultrasonics - Honolulu, HI, USA (4-7 Dec. 1990)] IEEE Symposium on Ultrasonics - The elastic properties of thin-film silicon nitride
Hickernell, T.S.; Fliegel, F.M.; Hickernell, F.S.
- 作者Hickernell, T.S.; Fliegel, F.M.; Hickernell, F.S.
- 文件大小372.42KB
- 发表时间1990
- DOI10.1109/ultsym.1990.171405
- 页码445-448