Formation of In/GaP(1̄ 1̄ 1̄) interface studied by energy loss spectroscopy, x-ray photoelectron spectroscopy, and ultraviolet photoelectron spectroscopy
- 期刊名称Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- 作者Yu, M. R.
- 卷第8卷
- 期第4期
- 印刷ISSN0734-211X
- 文件大小581.52KB
- 发表时间1990-7
- DOI10.1116/1.585022
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