The effect of interface roughness scattering and background impurity scattering on the thermopower of a 2DEG in a Si MOSFET
- 作者V. K. Karavolas; M. J. Smith; T. M. Fromhold; P. N. Butcher; B. G. Mulimani; B. L. Gallagher; J. P. Oxley
- 文件大小505.70KB
- 发表时间1990
- DOI10.1088/0953-8984/2/51/013
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