The nature of structural defects and thermal equilibrium effects on doped a-Si:H as elucidated by electron nuclear double resonance measurements
H. Yokomichi; K. Morigaki
- 作者H. Yokomichi; K. Morigaki
- 印刷ISSN0022-3093
- 文件大小268.30KB
- 发表时间1991
- DOI10.1016/s0022-3093(05)80086-9