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Measurement of InP/In0.53Ga0.47As and In0.53Ga0.47As/In0.52Al0.48As heterojunction band offsets by x‐ray photoemission spectroscopy

Measurement of InP/In0.53Ga0.47As and In0.53Ga0.47As/In0.52Al0.48As heterojunction band offsets by x‐ray photoemission spectroscopy

Waldrop, J. R.; Kraut, E. A.; Farley, C. W.; Grant, R. W.

作者Waldrop, J. R.; Kraut, E. A.; Farley, C. W.; Grant, R. W.
卷第69卷
期第1期
文件大小1008.49KB
发表时间1991
DOI10.1063/1.347724

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