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Ballistic electron emission testing of semiconductor heterostructures

Ballistic electron emission testing of semiconductor heterostructures

Gregory N. Henderson; Thomas K. Gaylord; Elias N. Glytsis; Phillip N. First; William J. Kaiser
  • 作者Gregory N. Henderson; Thomas K. Gaylord; Elias N. Glytsis; Phillip N. First; William J. Kaiser
  • 卷第80卷
  • 期第8期
  • 印刷ISSN0038-1098
  • 文件大小510.15KB
  • 发表时间1991
  • DOI10.1016/0038-1098(91)90158-r
  • 页码591-596
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