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[IEEE 29th Annual Reliability Physics 1991 - Las Vegas, NV, USA (9-11 April 1991)] 29th Annual Proceedings Reliability Physics 1991 - Comparison of dielectric wear-out between oxides grown in O/sub 2/ and N/sub 2/O

[IEEE 29th Annual Reliability Physics 1991 - Las Vegas, NV, USA (9-11 April 1991)] 29th Annual Proceedings Reliability Physics 1991 - Comparison of dielectric wear-out between oxides grown in O/sub 2/ and N/sub 2/O

Ting, W.; Lo, G.Q.; Ahn, J.; Chu, T.Y.; Kwong, D.-L.

作者Ting, W.; Lo, G.Q.; Ahn, J.; Chu, T.Y.; Kwong, D.-L.
文件大小303.55KB
发表时间1991
DOI10.1109/relphy.1991.146037
页码323-326

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