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[IEEE Comput. Soc. Press IEEE/ACM International Conference on Developing and Managing Expert System Programs - Washington, DC, USA (30 Sept.-2 Oct. 1991)] [1991] Proceedings of the IEEE/ACM International Conference on Developing and Managing Expert System Programs - A comparison of rule-based, k-nearest neighbor, and neural net classifiers for automated industrial inspection

[IEEE Comput. Soc. Press IEEE/ACM International Conference on Developing and Managing Expert System Programs - Washington, DC, USA (30 Sept.-2 Oct. 1991)] [1991] Proceedings of the IEEE/ACM International Conference on Developing and Managing Expert System Programs - A comparison of rule-based, k-nearest neighbor, and neural net classifiers for automated industrial inspection

Cho, T.-H.; Conners, R.W.; Araman, P.A.
  • 作者Cho, T.-H.; Conners, R.W.; Araman, P.A.
  • 文件大小658.58KB
  • 发表时间1991
  • DOI10.1109/dmesp.1991.171738
  • 页码202-209
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