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Measurement of the Thickness and Optical Properties of Thermal Oxides of Si Using Spectroscopic Ellipsometry and Stylus Profilometry

Measurement of the Thickness and Optical Properties of Thermal Oxides of Si Using Spectroscopic Ellipsometry and Stylus Profilometry

Mrstik, B. J.
  • 期刊名称Journal of The Electrochemical Society
  • 作者Mrstik, B. J.
  • 卷第138卷
  • 期第6期
  • 印刷ISSN0013-4651
  • 文件大小1116.76KB
  • 发表时间1991
  • DOI10.1149/1.2085871
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