Analysis of Vertical Cavity Surface Emitting Semiconductor Lasers
Ebeling, Karl Joachim; Hackbarth, Thomas
- 期刊名称Frequenz
- 作者Ebeling, Karl Joachim; Hackbarth, Thomas
- 卷第45卷
- 印刷ISSN0016-1136
- 电子ISSN2191-6349
- 文件大小996.18KB
- 发表时间1991-01
- DOI10.1515/FREQ.1991.45.9-10.207