SPIE Proceedings [SPIE Orlando '91, Orlando, FL - Orlando, FL (Monday 1 April 1991)] Surveillance Technologies - Optical delay tester
- 作者Wakana, Shin-ichi; Nagai, Toshiaki; Hama, Soichi; Goto, Yoshiro; Gowrinathan, Sankaran; Mataloni, Sr., Raymond J.; Schwartz, Stanley J.
- 卷第1479卷
- 印刷ISSN0277-786X
- 文件大小366.54KB
- 发表时间1991
- DOI10.1117/12.44538
- 页码283-290