Defining Residual Stresses in Thin Film Structures
- 期刊名称Advances in X-ray Analysis
- 作者Noyan, I. C.
- 卷第35卷
- 印刷ISSN0376-0308
- 电子ISSN2631-3626
- 文件大小529.95KB
- 发表时间1991
- DOI10.1154/S0376030800009149
- 页码461-473
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