Inverse Problems for Metal Oxide Semiconductor Field-Effect Transistor Contact Resistivity
- 期刊名称SIAM Journal on Applied Mathematics
- 作者Fang, Weifu; Cumberbatch, Ellis
- 卷第52卷
- 期第3期
- 印刷ISSN0036-1399
- 电子ISSN1095-712X
- 文件大小1048.30KB
- 发表时间1992-06
- DOI10.1137/0152039
- 页码699-709
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