[IEEE 30th Annual Proceedings Reliability Physics 1992 - San Diego, CA, USA (1992.03.31-1992.04.2)] 30th Annual Proceedings Reliability Physics 1992 - Dislocation based mechanisms in electromigration
Livesay, B.R.; Don, N.E.; Garrison, A.K.; Harris, H.M.; Hubbard, J.L.
- 作者Livesay, B.R.; Don, N.E.; Garrison, A.K.; Harris, H.M.; Hubbard, J.L.
- 文件大小1010.53KB
- 发表时间1992
- DOI10.1109/RELPHY.1992.187649
- 页码217-227