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[IEEE 1992 International Conference on Industrial Electronics, Control, Instrumentation, and Automation - San Diego, CA, USA (9-13 Nov. 1992)] Proceedings of the 1992 International Conference on Industrial Electronics, Control, Instrumentation, and Automation - Fault monitoring using neural networks

[IEEE 1992 International Conference on Industrial Electronics, Control, Instrumentation, and Automation - San Diego, CA, USA (9-13 Nov. 1992)] Proceedings of the 1992 International Conference on Industrial Electronics, Control, Instrumentation, and Automation - Fault monitoring using neural networks

Uhrig, R.E.
  • 作者Uhrig, R.E.
  • 文件大小699.59KB
  • 发表时间1992
  • DOI10.1109/iecon.1992.254388
  • 页码1449-1454
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