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[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - A direct, reliable, measurement-based technique for the extraction of an on-chip HBT dummy structure equivalent circuit

[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - A direct, reliable, measurement-based technique for the extraction of an on-chip HBT dummy structure equivalent circuit

Lu, K.; Perry, P.; Brazil, T.J.

作者Lu, K.; Perry, P.; Brazil, T.J.
文件大小196.49KB
发表时间1992
DOI10.1109/icmts.1993.292898
页码27-30

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