Ion bombardment of thin layers: The effect on the interface roughness and its x-ray reflectivity (invited)
- 期刊名称Review of Scientific Instruments
- 作者Puik, E. J.; van der Wiel, M. J.; Zeijlemaker, H.; Verhoeven, J.
- 卷第63卷
- 期第1期
- 印刷ISSN0034-6748
- 文件大小938.95KB
- 发表时间1992
- DOI10.1063/1.1143031
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