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Fundamental investigation of reflectometry as a density fluctuation diagnostic (invited)

Fundamental investigation of reflectometry as a density fluctuation diagnostic (invited)

Rhodes, T. L.; Baang, S.; Chou, A. E.; Domier, C. W.; Luhmann, N. C.; Peebles, W. A.
  • 期刊名称Review of Scientific Instruments
  • 作者Rhodes, T. L.; Baang, S.; Chou, A. E.; Domier, C. W.; Luhmann, N. C.; Peebles, W. A.
  • 卷第63卷
  • 期第10期
  • 印刷ISSN0034-6748
  • 文件大小1080.80KB
  • 发表时间1992
  • DOI10.1063/1.1143681
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