Fundamental investigation of reflectometry as a density fluctuation diagnostic (invited)
Rhodes, T. L.; Baang, S.; Chou, A. E.; Domier, C. W.; Luhmann, N. C.; Peebles, W. A.
- 期刊名称Review of Scientific Instruments
- 作者Rhodes, T. L.; Baang, S.; Chou, A. E.; Domier, C. W.; Luhmann, N. C.; Peebles, W. A.
- 卷第63卷
- 期第10期
- 印刷ISSN0034-6748
- 文件大小1080.80KB
- 发表时间1992
- DOI10.1063/1.1143681