[IEEE 30th Annual Proceedings Reliability Physics 1992 - San Diego, CA, USA (1992.03.31-1992.04.2)] 30th Annual Proceedings Reliability Physics 1992 - Relaxation phenomenon during electromigration under pulsed current
- 作者Hinode, K.; Furusawa, T.; Homma, Y.
- 文件大小432.47KB
- 发表时间1992
- DOI10.1109/relphy.1992.187647
- 页码205-210
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