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Application of the Focused-Ion-Beam Technique for Preparing the Cross-Sectional Sample of Chemical Vapor Deposition Diamond Thin Film for High-Resolution Transmission Electron Microscope Observation

Application of the Focused-Ion-Beam Technique for Preparing the Cross-Sectional Sample of Chemical Vapor Deposition Diamond Thin Film for High-Resolution Transmission Electron Microscope Observation

Tarutani, Masayoshi; Takai, Yoshizo; Shimizu, Ryuichi

期刊名称Japanese Journal of Applied Physics
作者Tarutani, Masayoshi; Takai, Yoshizo; Shimizu, Ryuichi
卷第31卷
印刷ISSN0021-4922
文件大小1688.50KB
发表时间1992-9-1
DOI10.1143/JJAP.31.L1305

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